Angstrom Scientific Inc. represents a number of leading manufacturers supporting materials imaging and analysis. These include Hitachi: tabletop SEMs, Imina: nano-probe system and Point: EBIC/EBAC, Leica: Sample prep., Deben: Tensile Stages, and NenoVision: in-Situ SEM AFM. Please visit our booth 1133 at MS&T to discuss your analysis needs.