Measure film thickness from 0–1000 nm w/ 0.001 nm precision!
The Film Sense FS-1™ Multi-Wavelength Ellipsometers realize many of the benefits of spectroscopic ellipsometry without all the cost and complication. Measure thin film thickness and index of refraction from 0 – 1000 nm with exceptional precision (0.001 nm) and accuracy! The FS-1 is easy to use, robust, and affordable, making it ideal for measurements in the research lab, classroom, in situ processing environments, industrial control, and more. Please visit http://www.film-sense.com for more information.