Film Sense

Lincoln,  NE 
United States
  • Booth: 1017

Measure film thickness from 0–1000 nm w/ 0.001 nm precision!

The Film Sense FS-1™ Multi-Wavelength Ellipsometers realize many of the benefits of spectroscopic ellipsometry without all the cost and complication.  Measure thin film thickness and index of refraction from 0 – 1000 nm with exceptional precision (0.001 nm) and accuracy!  The FS-1 is easy to use, robust, and affordable, making it ideal for measurements in the research lab, classroom, in situ processing environments, industrial control, and more.  Please visit for more information.

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