J.A. Woollam Co.

Lincoln,  NE 
United States
  • Booth: 114

The J.A. Woollam Company offers a wide range of spectroscopic ellipsometers for nondestructive materials characterization, including thin film thickness (single and multilayer), optical constants, composition, growth/etch rates, and more. Instruments available for research and manufacturing metrology covering spectral ranges from vacuum ultra-violet to far infrared. Offering table-top, in-line, and in-situ models.

Send Email

Type your information and click "Send Email" to send an email to this exhibitor. To return to the previous screen without saving, click "Reset".